Impulse Winding Testers 7720 Series of Wayne Kerr 

High voltage non-destructive analysis of winding identifies difficult to detect manufacturing faults.

There are a number of parameters that can change during manufacture that may affect the performance of a winding. These parameters, which cannot always be measured with an LCR meter, include change in material as well as shorted and damaged windings. The 7720 Impulse Winding Tester uses a very high voltage impulse to stimulate the device under test (DUT). It analyzes the decay waveform to detect changes in material, shorted and damaged windings and other errors. Long term decay of a winding can also be detected. The system used ensures that the component is tested but not damaged during the analysis process. The shape of the waveform is dictated by the Q factor, inductance and stray capacitance of the winding. High Q shows as a slow decay and the frequency of the waveform is determined by the inductance and stray capacitance of the DUT. Importantly, the short high voltage pulse causes no damage to the device under test.


  • 200 V to 5 kV production testing of manufactured components
  • Non-destructive analysis of winding
  • One button go / no-go testing
  • Multi winding
  • Identifies faulty manufacture without damaging components
  • Straightforward intuitive operation
  • Corona/flutter testing
  • Built in statistical analysis
  • Low cost for economical tests
  • 2, 4, 6 & 8 port versions