Diagnosys S500:
An easy-to-use scalable turnkey solution for the functional & diagnostic test of your LRUs, PCBs and electronic assemblies

The S500 Bench Test Equipment (BTE) is customized to test the Line Replaceable Unit (LRU) to determine the faulty Lowest Level Replaceable Unit (LLRU). Once a faulty LLRU is discovered, a separate application program specifically designed for the LLRU is executed to further isolate the fault.
The S500 can diagnostically test Printed Circuit Boards (PCBs) to a specified ambiguity group through the use of operator- assisted test point probing. The S500 test system can also export test data that will be used by a separate diagnostic BTE, such as the PinPoint test system.
The base S500 includes a 19-inch rack housing commercially available hardware including an industrial PC, Peripheral component interconnect extensions for Instrumentation (PXI) chassis for National Instruments (NI) test resources, power supplies, and a test head receiver. The software and system controllers required for automating the test process and evaluating the results are stored on the internal PC.
The instruments are controlled by application programs to apply signals and make measurements on the Unit Under Test (UUT).
All necessary test signals are available at the test head panel and are connected to the UUT using an Interface Test Adapter (ITA).
Application programs are accessed and executed through the use of Diagnosys Executive Software (ES). The ES user interface is a Graphical User Interface (GUI) with common Windows OS type of menus and functionality with ease of entry for new users.
The S500 test system includes a System Self-Test (SST) customized to each S500 configuration to provide testing of the hardware and software to indicate the systems functionality.
The system GUI can be configured by a system administrator to determine the interval between SST execution and thereby prevent system operation when the SST period has expired.

Multiple applications on a single system

  • Digital application
  • Analog application
  • Boundary Scan
  • RF
  • Customized testing

  • High Power
  • Electromechanical
  • Control Systems
  • Ease of use

  • Graphical interface
  • On-screen instructions
  • Interactive user instructions for all applications

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